• DocumentCode
    8122
  • Title

    A New Slit-Type Vacuum-Channel Transistor

  • Author

    In Jun Park ; Seok-Gy Jeon ; Changhwan Shin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Seoul, Seoul, South Korea
  • Volume
    61
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    4186
  • Lastpage
    4191
  • Abstract
    A new vacuum-channel transistor with a carbon nanotube cathode and nanometer-scale channel length-called a slit-type vacuum-channel transistor is proposed and investigated. The suggested device structure features distinguishable cutoff, linear, and saturation regions with a negligible gate leakage current. Its channel length is almost the same as the mean free path of carriers in air, which suggests that the device can operate not only in vacuum but also in air, without any performance degradation. Because of its geometrical characteristics, it is possible for this device to be operated when the anode bias is almost the same as the gate bias with negligible oxide leakage. Therefore, the device can be used as an elemental device component in digital integrated circuits.
  • Keywords
    carbon nanotubes; cathodes; transistors; vacuum microelectronics; anode bias; carbon nanotube cathode; device structure; gate bias; nanometer scale channel length; saturation regions; slit type vacuum channel transistor; Anodes; Cathodes; Leakage currents; Logic gates; Performance evaluation; Transistors; Vacuum systems; CST PARTICLE STUDIO; Carbon nanotube; vacuum transistor; vacuum transistor.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2361912
  • Filename
    6933916