• DocumentCode
    81254
  • Title

    The Quantum Metal Ferroelectric Field-Effect Transistor

  • Author

    Frank, David J. ; Solomon, Paul M. ; Dubourdieu, C. ; Frank, Martin M. ; Narayanan, Vijaykrishnan ; Theis, Thomas N.

  • Author_Institution
    IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    61
  • Issue
    6
  • fYear
    2014
  • fDate
    Jun-14
  • Firstpage
    2145
  • Lastpage
    2153
  • Abstract
    It has recently been suggested that ferroelectric (FE) negative capacitance effects can be used to achieve steep subthreshold slope field-effect transistors, which are greatly desired for reducing energy consumption in modern digital electronics. Here, we propose that this concept can be improved by the introduction of a very thin metal or metal-like layer (a quantum metal) between the FE and the semiconductor channel. We show how to design this layer so that it attenuates the polarization charge of the FE, applying an appropriate charge to the semiconductor, while at the same time presenting a relatively constant capacitance to the FE layer, as is needed to stabilize the negative capacitance regime. For homogeneous polarization, we estimate that this device (a QMFeFET) can have extremely steep subthreshold characteristics (2 mV/decade over 11 decades) and that its energy and delay performance are advantageous.
  • Keywords
    ferroelectric devices; field effect transistors; QMFeFET; digital electronics; energy consumption; ferroelectric negative capacitance effect; homogeneous polarization charge attenuation; metal-like layer; negative capacitance regime; quantum metal; quantum metal ferroelectric field-effect transistor; semiconductor channel; steep subthreshold slope field-effect transistor; very thin metal layer; Field effect transistors; Iron; Logic gates; Materials; Quantum capacitance; Ferroelectrics (FEs); field-effect transistor (FET); low power devices; negative capacitance; steep slope; steep slope.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2314652
  • Filename
    6799181