• DocumentCode
    813048
  • Title

    Charge-Gated Thin-Film Transistors for High Resolution Digital Imaging Applications

  • Author

    Taghibakhsh, Farhad ; Karim, Karim S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON
  • Volume
    29
  • Issue
    8
  • fYear
    2008
  • Firstpage
    859
  • Lastpage
    862
  • Abstract
    A field-effect thin-film transistor (TFT) with two gates, which are charge and voltage gates, is introduced. By applying a proper voltage to the voltage gate, the device is biased at a desired operating point or turned on and off, whereas the amount of charge deposited on the charge gate, which is embedded inside the dielectric, shifts the threshold voltage and therefore modulates the drain-source current. Such device finds application in sensor circuits, particularly high resolution sensor arrays, where it replaces both the transconducting amplifier and the addressing switch transistor, thus reducing transistor count per pixel. Device structure, operation, and characteristics are derived and discussed. A planar configuration of the charge-gated TFT was fabricated by using top-gate amorphous silicon TFTs and implemented in a 100-mum -pitch two-transistor active pixel sensor test structure.
  • Keywords
    amorphous semiconductors; field effect transistors; sensor arrays; thin film transistors; amorphous silicon TFT; charge gates; charge-gated thin-film transistors; drain-source current; field-effect thin-film transistor; high resolution digital imaging; high resolution sensor arrays; sensor circuits; switch transistor; threshold voltage; transconducting amplifier; voltage gates; Amorphous silicon; Dielectric devices; Digital images; Image resolution; Sensor arrays; Sensor phenomena and characterization; Switches; Switching circuits; Thin film transistors; Threshold voltage; Amorphous silicon (a-Si); digital imaging; high resolution; thin-film transistor (TFT);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2008.2000857
  • Filename
    4571132