• DocumentCode
    81673
  • Title

    Facial Age Estimation by Learning from Label Distributions

  • Author

    Xin Geng ; Chao Yin ; Zhi-Hua Zhou

  • Author_Institution
    Sch. of Comput. Sci. & Eng., Southeast Univ., Nanjing, China
  • Volume
    35
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2401
  • Lastpage
    2412
  • Abstract
    One of the main difficulties in facial age estimation is that the learning algorithms cannot expect sufficient and complete training data. Fortunately, the faces at close ages look quite similar since aging is a slow and smooth process. Inspired by this observation, instead of considering each face image as an instance with one label (age), this paper regards each face image as an instance associated with a label distribution. The label distribution covers a certain number of class labels, representing the degree that each label describes the instance. Through this way, one face image can contribute to not only the learning of its chronological age, but also the learning of its adjacent ages. Two algorithms, named IIS-LLD and CPNN, are proposed to learn from such label distributions. Experimental results on two aging face databases show remarkable advantages of the proposed label distribution learning algorithms over the compared single-label learning algorithms, either specially designed for age estimation or for general purpose.
  • Keywords
    face recognition; learning (artificial intelligence); neural nets; probability; visual databases; CPNN; IIS-LLD; chronological age; conditional probability neural network; face databases; face image; facial age estimation; label distribution learning algorithms; Aging; Algorithm design and analysis; Estimation; Humans; Neural networks; Training; Vectors; Age estimation; face image; label distribution; machine learning; Aging; Algorithms; Artificial Intelligence; Biometry; Face; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2013.51
  • Filename
    6475129