DocumentCode
817165
Title
Monitoring of optical signals from constellation diagrams measured with linear optical sampling
Author
Dorrer, Christophe
Author_Institution
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Volume
24
Issue
1
fYear
2006
Firstpage
313
Lastpage
321
Abstract
Linear optical sampling detects samples of the electric field of an optical waveform using its interference with a train of sampling pulses. This unique ability allows statistical electric-field characterization, for example, the measurement of a constellation diagram in the complex plane. From such information, one can directly track impairments that affect the phase and, more generally, the electric field of a data-encoded telecommunication channel. Constellation diagrams of 10-Gb/s phase-shift-keyed (PSK) signals are measured using a waveguide implementation of linear optical sampling. The intensity and phase fluctuations of these signals are quantified in various situations typically met in optical networks. The properties of various data-modulation schemes for phase-shift keying are investigated, and the noise induced by amplified spontaneous emission (ASE) on the electric field is directly quantified. Finally, a direct measurement of the Gordon-Mollenauer nonlinear phase noise is performed.
Keywords
fluctuations; optical modulation; optical noise; optical signal detection; phase noise; phase shift keying; signal sampling; superradiance; 10 Gbit/s; Gordon-Mollenauer nonlinear phase noise; amplified spontaneous emission; constellation diagrams; data modulation; electric-field characterization; intensity fluctuation; linear optical sampling; optical signal monitoring; optical waveform; phase fluctuation; phase-shift-keying; Constellation diagram; Monitoring; Nonlinear optics; Optical detectors; Optical noise; Optical waveguides; Phase measurement; Phase noise; Phase shift keying; Sampling methods; Electric field measurement, homodyne detection, interferometry, optical pulse measurements, phase shift keying;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2005.859831
Filename
1589062
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