• DocumentCode
    817165
  • Title

    Monitoring of optical signals from constellation diagrams measured with linear optical sampling

  • Author

    Dorrer, Christophe

  • Author_Institution
    Lucent Technol. Bell Labs., Holmdel, NJ, USA
  • Volume
    24
  • Issue
    1
  • fYear
    2006
  • Firstpage
    313
  • Lastpage
    321
  • Abstract
    Linear optical sampling detects samples of the electric field of an optical waveform using its interference with a train of sampling pulses. This unique ability allows statistical electric-field characterization, for example, the measurement of a constellation diagram in the complex plane. From such information, one can directly track impairments that affect the phase and, more generally, the electric field of a data-encoded telecommunication channel. Constellation diagrams of 10-Gb/s phase-shift-keyed (PSK) signals are measured using a waveguide implementation of linear optical sampling. The intensity and phase fluctuations of these signals are quantified in various situations typically met in optical networks. The properties of various data-modulation schemes for phase-shift keying are investigated, and the noise induced by amplified spontaneous emission (ASE) on the electric field is directly quantified. Finally, a direct measurement of the Gordon-Mollenauer nonlinear phase noise is performed.
  • Keywords
    fluctuations; optical modulation; optical noise; optical signal detection; phase noise; phase shift keying; signal sampling; superradiance; 10 Gbit/s; Gordon-Mollenauer nonlinear phase noise; amplified spontaneous emission; constellation diagrams; data modulation; electric-field characterization; intensity fluctuation; linear optical sampling; optical signal monitoring; optical waveform; phase fluctuation; phase-shift-keying; Constellation diagram; Monitoring; Nonlinear optics; Optical detectors; Optical noise; Optical waveguides; Phase measurement; Phase noise; Phase shift keying; Sampling methods; Electric field measurement, homodyne detection, interferometry, optical pulse measurements, phase shift keying;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.859831
  • Filename
    1589062