• DocumentCode
    817568
  • Title

    Simulation of SEU transients in CMOS ICs

  • Author

    Kaul, N. ; Bhuva, B.L. ; Kerns, S.E.

  • Author_Institution
    Vanderbilt Univ., Nashville, TN, USA
  • Volume
    38
  • Issue
    6
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1514
  • Lastpage
    1520
  • Abstract
    An efficient computer simulation algorithm set, SITA, predicts the vulnerability of data stored in and processed by complex combinational logic circuits to SEU. SITA is described in detail to allow researchers to incorporate it into their error analysis packages. Required simulation algorithms are based on approximate closed-form equations modeling individual device behavior in CMOS logic units. Device-level simulation is used to estimate the probability that ion-device interactions produce erroneous signals capable of propagating to a latch (or an output node), and logic-level simulation to predict the spread of such erroneous, latched information through the IC. Simulation results are compared to those from SPICE for several circuit and logic configurations. SITA results are comparable to this established circuit-level code, and SITA can analyze circuits with state-of-the-art device densities (which SPICE cannot). At all IC complexity levels, SITA offers several factors of 10 savings in simulation time over SPICE
  • Keywords
    CMOS integrated circuits; circuit analysis computing; combinatorial circuits; integrated circuit testing; integrated logic circuits; ion beam effects; logic testing; transients; CMOS ICs; SEU transients; SITA; SPICE; closed-form equations; combinational logic circuits; computer simulation algorithm; device level simulation; erroneous signals; error analysis packages; ion-device interactions; logic-level simulation; simulation time; Circuit simulation; Combinational circuits; Computational modeling; Computer simulation; Error analysis; Logic devices; Packaging; Prediction algorithms; Predictive models; SPICE;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.124140
  • Filename
    124140