• DocumentCode
    820956
  • Title

    Satellite SGEMP Surface Current Simulation Techniques a Theoretical Investigation

  • Author

    Mangan, D.L. ; Perala, R.A.

  • Author_Institution
    Mission Research Corporation Albuquerque, New Mexico 87108
  • Volume
    22
  • Issue
    6
  • fYear
    1975
  • Firstpage
    2420
  • Lastpage
    2427
  • Abstract
    In this paper we examine, theoretically, various simulation techniques which are considered feasible means to reproduce the external surface currents on satellite structures which result from system generated electromagnetic pulses (SGEMP). These techniques include a) plane wave excitation, b) monopole near-field excitation (in the limit of small monopole-to-satellite spacing, this can be considered capacitance coupling excitation), c) hardwire (from satellite to ground) current injection excitation, and d) charge injection excitation using a small self-contained pulser. The simulation effectiveness of each of these techniques, based on the ability of the simulation method to reproduce surface currents comparable to those predicted for generic SGEMP excitation, is explored. The conclusions gleaned from this investigation are the followinq: 1) the monopole excitation technique produces responses that simulate most favorably those predicted for the SGEMP excitation; 2) either current injection scheme (c or d above) will produce responses comparable to those predicted for local electron emission excitation provided the excitation scheme is sufficiently decoupled from the satellite; and 3) plane wave excitation produces responses that are significantly different both in the peak magnitude variation around the satellite body, and in the frequency content of the pulses, from those predicted for SGEMP.
  • Keywords
    Cables; Capacitance; Coupling circuits; EMP radiation effects; Electron emission; Frequency; Predictive models; Pulse generation; Satellites; Space charge;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4328144
  • Filename
    4328144