• DocumentCode
    821326
  • Title

    Radiation Effects in Charge Coupled Devices

  • Author

    Williams, Ross A. ; Nelson, Richard D.

  • Author_Institution
    Rockwell International Corporation Electronics Research Division 3370 Miraloma Avenue, Anaheim, California
  • Volume
    22
  • Issue
    6
  • fYear
    1975
  • Firstpage
    2639
  • Lastpage
    2644
  • Keywords
    Charge coupled devices; Charge-coupled image sensors; Electrodes; Ionizing radiation; MOS capacitors; Neutrons; Potential well; Radiation effects; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1975.4328182
  • Filename
    4328182
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=821326