• DocumentCode
    821331
  • Title

    Reliable Systems on Unreliable Fabrics

  • Author

    Austin, Todd ; Bertacco, Valeria ; Mahlke, Scott ; Cao, Yu

  • Author_Institution
    CSE-ACAL Lab., Michigan Univ., Ann Arbor, MI
  • Volume
    25
  • Issue
    4
  • fYear
    2008
  • Firstpage
    322
  • Lastpage
    332
  • Abstract
    The continued scaling of silicon fabrication technology has led to significant reliability concerns, which are quickly becoming a dominant design challenge. Design integrity is threatened by complexity challenges in the form of immense designs defying complete verification, and physical challenges such as silicon aging and soft errors, which impair correct system operation. The Gigascale Systems Research Center Resilient-System Design Team is addressing these key challenges through synergistic research thrusts, ranging from near-term reliability stress reduction techniques to methods for improving the quality of today´s silicon, to longer-term technologies that can detect, recover, and repair faulty systems. These efforts are supported and complemented by an active fault-modeling research effort and a strong focus on functional-verification methodologies. The team´s goal is to provide highly effective, low-cost solutions to ensure both correctness and reliability in future designs and technology nodes, thereby extending the lifetime of silicon fabrication technologies beyond what can be currently foreseen as profitable.
  • Keywords
    design engineering; fabrics; reliability; Gigascale Systems Research Center Resilient-System Design Team; active fault-modeling research effort; design integrity; fabric unreliability; functional-verification methodologies; silicon fabrication technology; stress reduction techniques; Circuit faults; Costs; Data communication; Fabrication; Fabrics; Integrated circuit noise; Lithography; Semiconductor device noise; Silicon; Threshold voltage; GSRC; Resilient-System Design Team; fault-modeling research; reliability stress reduction; reliable systems; silicon fabrication technologies; unreliable fabrics;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2008.107
  • Filename
    4584456