DocumentCode
823080
Title
II-VI blue-green laser diodes
Author
Ishibashi, Akira
Author_Institution
Res. Center, Sony Corp., Yokohama, Japan
Volume
1
Issue
2
fYear
1995
fDate
6/1/1995 12:00:00 AM
Firstpage
741
Lastpage
748
Abstract
ZnMgSSe, forming a type I heterostructure with Zn(Cd)Se, fully lattice-matched to GaAs with an energy gap tunable up to ~4.5 eV, has made possible continuous-wave (CW) operation of both a green laser diode (LD) and a blue LD at room temperature. The device characteristics of the II-VI wide-gap LD´s are becoming as good as those of established III-V LD´s, except for device lifetime. Remaining key issues are p-doping in the wide-gap ZnMgSSe and reliability of II-VI wide gap LD´s. Valence-band engineering via superlattice (SL) use is proposed, based on the amphoteric defect model, for removing the doping limit in the p-type ZnMgSSe. This will lead to CW operation of a blue-emitting laser diode with a wavelength of 450 ~ 460 mm. For reliability, employing a GaAs-buffer layer has made possible room-temperature (RT) CW operation with a lifetime of 1 hour. Analysis of the degradation process shows that no catastrophically fast degradation occurs when II-VI LD´s degrade. The reliability of the ZnMgSSe-based LD´s would soon be established, and the II-VI wide-gap LD´s will likely blossom colorfully in the near future
Keywords
II-VI semiconductors; energy gap; ion implantation; laser beams; laser reliability; laser tuning; magnesium compounds; semiconductor device reliability; semiconductor lasers; wide band gap semiconductors; zinc compounds; 298 K; 4.5 eV; 450 to 460 nm; CW operation; CdSe; GaAs-buffer layer; ZnMgSSe; ZnSe; amphoteric defect mode; blue laser diode; blue-green laser diodes; continuous-wave operation; degradation process; device characteristics; device lifetime; doping limit; energy gap; green laser diode; p-doping; reliability; room temperature; superlattice; type I heterostructure; valence-band engineering; wide-gap semiconductor; Degradation; Diode lasers; Doping; Gallium arsenide; III-V semiconductor materials; Reliability engineering; Semiconductor process modeling; Superlattices; Temperature; Tunable circuits and devices;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/2944.401266
Filename
401266
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