• DocumentCode
    824957
  • Title

    Performance trade-offs in a parallel test generation/fault simulation environment

  • Author

    Patil, Srinivas ; Banerjee, Prithviraj

  • Author_Institution
    IBM Corp., Poughkeepsie, NY, USA
  • Volume
    10
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1542
  • Lastpage
    1558
  • Abstract
    Heuristics are proposed to partition faults for parallel test generation with minimization of both the overall run time and test length as an objective. For efficient utilization of available processors, the work load has to be balanced at all times. Since it is very difficult to predict how difficult it will be to generate a test for a particular fault, the authors propose a load balancing method which uses static partitioning initially and then uses dynamic allocation of work for processors which become idle. A theoretical model is presented to predict the performance of the parallel test generation/fault simulation process. Experimental results based on an implementation of the Intel IPSC/2 hypercube multiprocessor using the ISCAS combinational benchmark circuits are presented
  • Keywords
    automatic testing; circuit analysis computing; digital simulation; fault location; logic testing; parallel processing; ISCAS combinational benchmark circuits; Intel IPSC/2 hypercube; dynamic allocation; fault simulation environment; heuristics; load balancing method; logic circuits; minimization; multiprocessor; parallel test generation; run time; static partitioning; test length; theoretical model; Acceleration; Circuit faults; Circuit testing; Hardware; Logic testing; Minimization; Parallel processing; Partitioning algorithms; Performance analysis; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.103504
  • Filename
    103504