DocumentCode
824957
Title
Performance trade-offs in a parallel test generation/fault simulation environment
Author
Patil, Srinivas ; Banerjee, Prithviraj
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
Volume
10
Issue
12
fYear
1991
fDate
12/1/1991 12:00:00 AM
Firstpage
1542
Lastpage
1558
Abstract
Heuristics are proposed to partition faults for parallel test generation with minimization of both the overall run time and test length as an objective. For efficient utilization of available processors, the work load has to be balanced at all times. Since it is very difficult to predict how difficult it will be to generate a test for a particular fault, the authors propose a load balancing method which uses static partitioning initially and then uses dynamic allocation of work for processors which become idle. A theoretical model is presented to predict the performance of the parallel test generation/fault simulation process. Experimental results based on an implementation of the Intel IPSC/2 hypercube multiprocessor using the ISCAS combinational benchmark circuits are presented
Keywords
automatic testing; circuit analysis computing; digital simulation; fault location; logic testing; parallel processing; ISCAS combinational benchmark circuits; Intel IPSC/2 hypercube; dynamic allocation; fault simulation environment; heuristics; load balancing method; logic circuits; minimization; multiprocessor; parallel test generation; run time; static partitioning; test length; theoretical model; Acceleration; Circuit faults; Circuit testing; Hardware; Logic testing; Minimization; Parallel processing; Partitioning algorithms; Performance analysis; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.103504
Filename
103504
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