• DocumentCode
    824997
  • Title

    A generalized Scharfetter-Gummel method to eliminate crosswind effects [semiconduction device modeling]

  • Author

    He, Yie ; Cao, Guoxiang

  • Author_Institution
    Microelectron. Center, Southeast Univ., Nanjing, China
  • Volume
    10
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1579
  • Lastpage
    1582
  • Abstract
    A generalized Scharfetter-Gummel discretization method is proposed for semiconductor device modeling. Motivated by the classical Scharfetter-Gummel approach and the SUPG (streamline upwind/Petrov-Galerkin) method, an optimal nonlinear artificial diffusion term is added to the standard Galerkin finite element formula within a weighted residual form to construct the generalized Scharfetter-Gummel method, which exhibits better properties in precluding numerical oscillation and crosswind effects than the classical Scharfetter-Gummel method and the SUPG method. The generalized Scharfetter-Gummel method is more general and applicable to complicated problems
  • Keywords
    semiconductor device models; crosswind effects elimination; discretization method; generalized Scharfetter-Gummel method; optimal nonlinear artificial diffusion term; semiconductor device modeling; standard Galerkin finite element formula; weighted residual form; Aerodynamics; Electron mobility; Finite element methods; Fluid dynamics; Helium; Microelectronics; Moment methods; Nonlinear equations; Semiconductor device modeling; Stability;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.103508
  • Filename
    103508