DocumentCode
825578
Title
Identify unrepairability to speed-up spare allocation for repairing memories
Author
Liang, Hsing-Chung ; Ho, Wen-Chin ; Cheng, Ming-Chieh
Author_Institution
Dept. of Electron. Eng., Chang Gung Univ., Tao-Yuan, Taiwan
Volume
54
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
358
Lastpage
365
Abstract
In this paper, we discuss some strategies for identifying unrepairable memories, and from that to introduce a novel theorem that can make more precise identification. A new algorithm for searching repair solutions is also proposed, which characterizes the rows, and columns of defective memory cells with revised effective coefficients. We have simulated it on many generated example maps, and compared it with the previous algorithms to verify its efficiency. It´s combined with those arranged strategies of judging unrepairability to generate a complete flow. The complete algorithm has also been run on many examples with various memory sizes, defect numbers, and distribution types. The simulation results further show that identifying unrepairability in advance can help the reconfiguration procedure run much faster than searching solutions directly.
Keywords
digital storage; fault diagnosis; identification; maintenance engineering; redundancy; reliability theory; defect number; defective memory cell; distribution type; judging unrepairability; memory redundancy; memory sizes; precise identification; repair solution searching; repairing memories; speed-up spare allocation; unrepairability identification; unrepairable memories; Bipartite graph; Clustering algorithms; Cost function; Councils; Fault detection; Fault diagnosis; Lead; Production; Redundancy; Testing; Memory redundancy; reconfiguration; repair solution; repairability; spare allocation;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2005.847248
Filename
1435730
Link To Document