• DocumentCode
    825904
  • Title

    Mind the gap [transistor costs]

  • Author

    Edwards, Chris

  • Volume
    82
  • Issue
    5
  • fYear
    2003
  • Firstpage
    44
  • Lastpage
    47
  • Abstract
    The cost of testing each transistor on a chip in 2000 was less than a hundredth of its manufacturing cost. But, within ten years, test costs could have increased and manufacturing costs fallen to the point where the two cross over.
  • Keywords
    integrated circuit economics; integrated circuit testing; IC manufacture costs; IC testing costs;
  • fLanguage
    English
  • Journal_Title
    Manufacturing Engineer
  • Publisher
    iet
  • ISSN
    0956-9944
  • Type

    jour

  • DOI
    10.1049/me:20030509
  • Filename
    1245158