• DocumentCode
    826582
  • Title

    Beam Profile Monitor Provides Multiple Profile during Beam Spill at Fermilab

  • Author

    Haldeman, M. ; Haynes, B. ; Lahey, T.

  • Volume
    24
  • Issue
    1
  • fYear
    1977
  • Firstpage
    430
  • Lastpage
    434
  • Abstract
    A sampling, 96 channel NIM module scanner, which when used in conjunction with Fermilab´s conventional 96 wire ionization chambers (WIC´s), provides up to ten (96-channel) samples of the charged particle beam profiles during a beam spill. The ability to sample as often as four milliseconds, with minimum sample times of 1 ¿second, allows this system to be used at particle rates from 105 to 1014 particles per second per wire, making it useful for beam tuning as well as normal running. The 96 analog channels are digitized after each sample and stored in a 1K × 12 bid RAM. The RAM provides data for local analog output, through a D/A coverter/driver and for block data transfers via a CAMAC controller module to a processor for software data manipulation.
  • Keywords
    CAMAC; Capacitors; Connectors; Monitoring; Particle beams; Pulse amplifiers; Sampling methods; Testing; Voltage; Wire;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1977.4328717
  • Filename
    4328717