• DocumentCode
    828216
  • Title

    Modeling of the resistive losses due to the bus-bar and external connections in III-V high-concentrator solar cells

  • Author

    Rey-Stolle, Ignacio ; Algora, Carlos

  • Author_Institution
    E.T.S.I. de Telecomunicacion, Madrid Polytech. Univ., Spain
  • Volume
    49
  • Issue
    10
  • fYear
    2002
  • fDate
    10/1/2002 12:00:00 AM
  • Firstpage
    1709
  • Lastpage
    1714
  • Abstract
    A model for the analysis of the resistive losses due to current flow through the bus-bar and external connections, mainly focused on III-V high-concentrator solar cells, is presented. Initially, a formulation that takes two-dimensional current flow into account in the bus-bar is proposed for calculating the bus-bar equivalent resistance. Next, a simplification assuming a one-dimensional (1-D) current flow is considered and a fully analytical model is obtained. Then, both models are compared and the applicability range of the 1-D approximation is established. The model is then applied to the analysis of the inverted square grid with several configurations for the external connections. Finally, the potential of the model is illustrated with a set of simulations carried out using a 1000× concentrator GaAs solar cell and a number of conclusions of practical and technological interest are extracted.
  • Keywords
    III-V semiconductors; busbars; electric connectors; gallium arsenide; losses; semiconductor device models; solar cells; 1-D approximation; GaAs; GaAs solar cell; III-V high-concentrator solar cells; bus-bar connections; bus-bar equivalent resistance; current flow; external connection configurations; external connections; fully analytical model; inverted square grid; model; one-dimensional current flow; photovoltaic cells; resistive losses; two-dimensional current flow; Analytical models; Circuit faults; Costs; Fabrication; Forward contracts; Gallium arsenide; III-V semiconductor materials; Photovoltaic cells; Stacking; Telecommunications;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2002.803638
  • Filename
    1036077