• DocumentCode
    833127
  • Title

    Strip detector for short-range particles

  • Author

    Rosenfeld, A.B. ; Pugatch, V.M. ; Zinets, O.S. ; Litovchenko, P.G. ; Barabash, L.I. ; Pavlenko, Yu.N. ; Vasilyev, Yu.O.

  • Author_Institution
    Inst. for Nucl. Res., Kiev, Ukraine
  • Volume
    39
  • Issue
    4
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    645
  • Lastpage
    649
  • Abstract
    A silicon strip detector for the coordinate determination of short-range charged particles, particularly heavy ions, has been developed. The detector has 28 p+n strips made by ion implantation. The pitch is 250 μm, and the interstrip distance is 50 μm. The coordinates of particles incident between adjacent strips are determined by two-dimensional amplitude analysis of the charges collected on neighboring strips. Irradiation with α-particles of 226Ra and a scanning laser beam was used. A coordinate determination accuracy of better than 1 μm was obtained. In contrast to the minimum ionized particle, the plasma tracks of short-range particles have higher carrier densities and were located in the inhomogeneity region of the detector. The study of the charge collection times has clarified the essential role of the drift of charges in an inhomogeneous electrical field, dependent on the detector geometry, and the inhomogeneity of silicon and built-in charge in passivating the oxide layer between the p+n strips
  • Keywords
    alpha-particle detection and measurement; position sensitive particle detectors; semiconductor counters; α-particles; 250 micron; 50 micron; Si; charge collection times; coordinate determination; inhomogeneity region; oxide layer; p+n strips; short-range charged particles; two-dimensional amplitude analysis; Charge carrier density; Detectors; Ion implantation; Laser beams; Nonuniform electric fields; Particle tracking; Plasma density; Plasma immersion ion implantation; Silicon; Strips;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.159680
  • Filename
    159680