Transport properties of Nb/yttria-stabilized-zirconia/Nb Josephson junctions

Author

Lam, Simon K H ; Gnanarajan, Sabaratnasingam

Author_Institution

Appl. Quantum Syst. Group, CSIRO Ind. Phys., NSW, Australia

Volume

15

Issue

2

fYear

2005

fDate

6/1/2005 12:00:00 AM

Firstpage

137

Lastpage

140

Abstract

Nb/yttria-stabilized zirconia (YSZ)/Nb Josephson junctions have been fabricated. The YSZ interlayer resistivity was found to have values of ∼1 mΩ - m and has a weak temperature dependence. The current-voltage characteristics at temperatures from 4.2 K to values close to the Nb critical temperature of ∼8.0 K have been studied. The junction critical current was found to have an exponential relationship with both the YSZ interlayer length and the temperature. These results are consistent with the predicted behavior of a superconductor-normal metal-superconductor junction due to the proximity effect.

Keywords

Josephson effect; critical currents; niobium; proximity effect (superconductivity); superconducting junction devices; superconductor-normal-superconductor devices; yttrium compounds; zirconium compounds; 4.2 to 8.0 K; Nb-Y₂O₃ZrO₂-Nb; Nb-YSZ-Nb Josephson junctions; critical temperature; current-voltage characteristics; interlayer resistivity; junction critical current; proximity effect; superconductor-normal metal-superconductor junction; transport properties; weak temperature dependence; yttria-stabilized zirconia; Conductivity; Critical current; Current-voltage characteristics; Electrodes; Josephson junctions; Niobium; Proximity effect; Superconducting devices; Temperature dependence; Tin; High current density; Josephson effect; SNS junctions; YSZ;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2005.849716

Filename

1439595