DocumentCode
834784
Title
Stacked Nb-MoSi2-Nb Josephson junctions for AC voltage standards
Author
Dresselhaus, Paul D. ; Chong, Yonuk ; Benz, Samuel P.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume
15
Issue
2
fYear
2005
fDate
6/1/2005 12:00:00 AM
Firstpage
449
Lastpage
452
Abstract
Superconductor-normal metal-superconductor (SNS) Josephson junctions have proven to be a critical technology for voltage standards. NIST has used SNS junctions for both dc and ac programmable voltage standards. Previous devices have used primarily PdAu as a normal-metal barrier material. In this paper we present measurements of circuits having MoSi2 barriers. Stacking enables the junctions to be packed more densely, thus increasing design flexibility and margins for the microwave circuits. In this work, measurements are presented from two- and three-junction stacks for application to ac Josephson voltage standards, which show output voltage and distortion near our best previously published results.
Keywords
measurement standards; microwave integrated circuits; molybdenum compounds; niobium; superconducting integrated circuits; superconductor-normal-superconductor devices; voltage measurement; AC voltage standards; Nb-MoSi2-Nb; SNS junction devices; ac Josephson voltage standards; circuit measurements; stacked Josephson junctions; superconducting devices; superconductor-normal metal-superconductor Josephson junctions; three-junction stacks; two-junction stacks; Distortion measurement; Flexible printed circuits; Josephson junctions; Microwave circuits; NIST; Stacking; Superconducting devices; Superconducting materials; Superconducting microwave devices; Voltage; Digital-analog conversion; Josephson arrays; superconducting devices; superconducting films; thin film devices;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2005.849871
Filename
1439671
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