DocumentCode
836747
Title
Voltage fluctuations on distribution level introduced by photovoltaic systems
Author
Woyte, Achim ; Van Thong, Vu ; Belmans, Ronnie ; Nijs, Johan
Author_Institution
3E sa, Bruxelles, Belgium
Volume
21
Issue
1
fYear
2006
fDate
3/1/2006 12:00:00 AM
Firstpage
202
Lastpage
209
Abstract
In moderate climates, short fluctuations in solar irradiance and their impact on the distribution grid will become an important issue with regard to the future large-scale application of embedded photovoltaic systems. Several related studies from the past are recalled. The approach that is presented here applies a localized spectral analysis to the solar irradiance and derived quantities in order to determine the power content of fluctuations, depending on their characteristic persistence. Pseudorandom time series of solar irradiance, based on measured values of the instantaneous clearness index, are applied as input data. Power-flow calculations are carried out in order to assess the impact of fluctuating solar irradiance on the grid voltage. The "fluctuation power index" is defined as a measure for the mean-square value of fluctuations of a specific persistence. A typical scenario is simulated, and the results are interpreted.
Keywords
distributed power generation; load flow; photovoltaic power systems; power grids; power system interconnection; distribution grid; distribution level; embedded photovoltaic systems; fluctuation power index; instantaneous clearness index; large-scale application; mean square value; power flow calculations; pseudorandom time series; solar irradiance; spectral analysis; voltage fluctuations; Contracts; Large-scale systems; Medium voltage; Photovoltaic systems; Random number generation; Solar power generation; Spectral analysis; Time measurement; Voltage fluctuations; Wind energy generation; Dispersed storage and generation; Monte Carlo methods; random number generation; signal analysis; solar energy; solar radiation; wavelet transforms;
fLanguage
English
Journal_Title
Energy Conversion, IEEE Transactions on
Publisher
ieee
ISSN
0885-8969
Type
jour
DOI
10.1109/TEC.2005.845454
Filename
1597338
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