DocumentCode
837145
Title
Radiation-hard strip detectors on oxygenated silicon
Author
Andricek, L. ; Lutz, G. ; Moser, H.G. ; Richter, R.H.
Author_Institution
MPI Halbleiterlabor, Munchen, Germany
Volume
49
Issue
3
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1117
Lastpage
1121
Abstract
Recent results of the RD48 (ROSE) collaboration suggest the usage of oxygen-enriched silicon for sensors operated in the harsh radiation environment of future high luminosity experiments. To investigate if the anticipated beneficial properties are still present after full processing of the wafers, full-size strip detectors designed for the innermost ring of the ATLAS forward region have been fabricated on oxygen-enriched silicon by CiS, Germany. These sensors, together with sensors processed in exactly the same way on standard substrates of different thickness, have been exposed to 3×1014 24 GeV/c protons/cm2 at the CERN PS. After irradiation, the sensors went through a controlled annealing up to an equivalent annealing time of 32 d at 25°C. We are presenting the comparison between these sensors based on I-V and C-V measurements and the investigation of the charge-collection efficiency obtained with a 90Sr source and fast analog readout at Large Hadron Collider speed.
Keywords
nuclear electronics; position sensitive particle detectors; proton effects; radiation hardening (electronics); readout electronics; silicon radiation detectors; 24 GeV; 25 degC; 32 d; 90Sr; ATLAS forward region; LHC; Large Hadron Collider; ROSE; Si; charge-collection efficiency; controlled annealing; fast analog readout; full-size strip detectors; high luminosity experiments; oxygenated silicon; proton beams; radiation-hard strip detectors; Annealing; Capacitance-voltage characteristics; Collaboration; Computational Intelligence Society; Current measurement; Protons; Radiation detectors; Silicon radiation detectors; Strips; Thickness control;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2002.1039624
Filename
1039624
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