• DocumentCode
    842949
  • Title

    Degradation and reversibility of critical current due to transverse compressive stress in Ta-reinforced Nb3Sn superconducting strand

  • Author

    Takao, Tomoaki ; Ito, Toru ; Umekawa, Kenji ; Fukasawa, Yuta ; Tanaka, Hideki ; Umeda, Masaichi

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Sophia Univ., Tokyo, Japan
  • Volume
    15
  • Issue
    2
  • fYear
    2005
  • fDate
    6/1/2005 12:00:00 AM
  • Firstpage
    3446
  • Lastpage
    3449
  • Abstract
    We have experimentally studied the degradation of the superconducting properties owing to transverse compressive stress in two kinds of Ta-reinforced Nb3Sn superconductor. This paper reports the Ic degradation of those conductors due to stress exceeding the irreversible strain limit and the Ic behavior after releasing the stress. The Ic was measured in a 14 T background magnetic field at 4 K while applying a transverse compressive stress to the Nb3Sn conductors. After measuring the Ic, the stress was released to zero, and the Ic was measured again. And then, a stress that was a little larger than the former stress was applied again and the Ic was measured. According to the experimental results on the better performance conductor, even if the Ic decreased to 60 percent of the initial value, the Ic recovered to approximately 90% of the initial value when the stress became zero. The measured results of those conductors are shown, and the performance of the conductors against the transverse-compressive force is compared.
  • Keywords
    critical current density (superconductivity); niobium alloys; superconducting magnets; superconducting tapes; tantalum; tensile testing; tin alloys; 14 T; 4 K; Nb3Sn; Ta; Ta-reinforced superconducting strand; compressive stress; critical current degradation; critical current reversibility; magnetic field; strain limit; superconducting property; Compressive stress; Conductors; Critical current; Degradation; Force measurement; Magnetic field induced strain; Magnetic field measurement; Niobium; Stress measurement; Tin; Compressive stress; critical current;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2005.849053
  • Filename
    1440413