DocumentCode
84328
Title
Development and Analysis of Interturn Short Fault Model of PMSMs With Series and Parallel Winding Connections
Author
Bon-Gwan Gu ; Jun-Hyuk Choi ; In-Soung Jung
Author_Institution
Korea Electron. Technol. Inst., Bucheon, South Korea
Volume
29
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
2016
Lastpage
2026
Abstract
In this study, interturn short fault models of permanent magnet synchronous motors (PMSMs) employing series and parallel winding connections are developed using deformed flux models based on both fault winding flux information and inductance variations caused by cross flux linkages that depend on the distribution of same phase windings. As these models take into account fault winding within a three-phase winding dynamics analysis, they constitute fourth-order assessments. In the parallel-winding model, an additional dynamical analysis is used to describe variations in current distribution caused by the parallel connection between fault and healthy windings. Based on deformed flux modeling and positive sequence current assumptions, the proposed model is derived in both positive and negative sequence synchronous reference frames. A finite-element method-based simulation is applied to validate the proposed PMSM model.
Keywords
current distribution; fault diagnosis; finite element analysis; machine windings; magnetic flux; permanent magnet motors; synchronous motors; PMSM; cross flux linkages; current distribution; deformed flux models; fault winding flux information; finite-element method based simulation; fourth-order assessments; inductance variations; interturn short fault models; negative sequence synchronous reference frames; parallel winding connections; permanent magnet synchronous motors; positive sequence synchronous reference frames; same phase windings; series winding connections; three-phase winding dynamics analysis; Fault model; motor interturn short fault; negative sequence; permanent magnet synchronous motors (PMSM); positive sequence;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2013.2265400
Filename
6522484
Link To Document