DocumentCode
844179
Title
Intensity noise in 1.5 mu m GaInAs quantum well buried heterostructure lasers
Author
Westbrook, L.D. ; Fletcher, N.C. ; Cooper, Diana Marina ; Stevenson, Mark ; Spurdens, P.C.
Author_Institution
British Telecom Res. Labs., Ipswich, UK
Volume
25
Issue
17
fYear
1989
Firstpage
1183
Lastpage
1184
Abstract
Intensity noise has been measured for the first time in GaInAs quantum well lasers. The noises in quantum well and bulk lasers are found to be comparable when the resonance frequencies and lengths are made equal; consequently, for a given emitted optical power quantum well lasers have wider bandwidths and lower noise, as a result of their higher resonance frequencies.
Keywords
III-V semiconductors; electron device noise; gallium arsenide; indium compounds; semiconductor junction lasers; semiconductor quantum wells; 1.5 micron; GaInAs; bandwidths; emitted optical power; intensity noise; quantum well buried heterostructure lasers; resonance frequencies;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890793
Filename
41957
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