DocumentCode
84559
Title
Leveraging Process Variation for Performance and Energy: In the Perspective of Overclocking
Author
Hyung Beom Jang ; Junhee Lee ; Joonho Kong ; Taeweon Suh ; Sung Woo Chung
Author_Institution
Dept. of Comput. & Radio Commun. Eng., Korea Univ., Seoul, South Korea
Volume
63
Issue
5
fYear
2014
fDate
May-14
Firstpage
1316
Lastpage
1322
Abstract
Process variation is one of the most important factors to be considered in recent microprocessor design, since it negatively affects performance, power, and yield of microprocessors. However, by leveraging process variation, overclocking techniques can improve performance. As microprocessors have substantial clock cycle time margin for yield, there is enough room for performance improvement by overclocking techniques. In this paper, we adopt the F-overclocking technique, which increases clock frequency without changing supply voltage. Our experimental results show that the F-overclocking technique significantly improves performance as well as energy consumption. In addition, the F-overclocking technique is superior to the conventional overclocking technique which increases clock frequency and supply voltage together in the perspective of energy efficiency and reliability, showing similar performance improvement. Furthermore, we propose an adaptive overclocking controller which dynamically applies the F-overclocking technique based on the application characteristics. By adopting our adaptive overclocking controller, we further minimize the reliability loss caused by the F-overclocking technique.
Keywords
adaptive control; energy conservation; microprocessor chips; power aware computing; power consumption; F-overclocking technique; adaptive overclocking controller; clock frequency; energy consumption; energy efficiency; leveraging process variation; microprocessor design; performance improvement; reliability; substantial clock cycle time margin; supply voltage; Clocks; Delay; Energy consumption; Low voltage; Microprocessors; Power demand; Reliability; Overclocking; energy efficiency; performance; process variation; reliability;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.2012.286
Filename
6374616
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