• DocumentCode
    84559
  • Title

    Leveraging Process Variation for Performance and Energy: In the Perspective of Overclocking

  • Author

    Hyung Beom Jang ; Junhee Lee ; Joonho Kong ; Taeweon Suh ; Sung Woo Chung

  • Author_Institution
    Dept. of Comput. & Radio Commun. Eng., Korea Univ., Seoul, South Korea
  • Volume
    63
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1316
  • Lastpage
    1322
  • Abstract
    Process variation is one of the most important factors to be considered in recent microprocessor design, since it negatively affects performance, power, and yield of microprocessors. However, by leveraging process variation, overclocking techniques can improve performance. As microprocessors have substantial clock cycle time margin for yield, there is enough room for performance improvement by overclocking techniques. In this paper, we adopt the F-overclocking technique, which increases clock frequency without changing supply voltage. Our experimental results show that the F-overclocking technique significantly improves performance as well as energy consumption. In addition, the F-overclocking technique is superior to the conventional overclocking technique which increases clock frequency and supply voltage together in the perspective of energy efficiency and reliability, showing similar performance improvement. Furthermore, we propose an adaptive overclocking controller which dynamically applies the F-overclocking technique based on the application characteristics. By adopting our adaptive overclocking controller, we further minimize the reliability loss caused by the F-overclocking technique.
  • Keywords
    adaptive control; energy conservation; microprocessor chips; power aware computing; power consumption; F-overclocking technique; adaptive overclocking controller; clock frequency; energy consumption; energy efficiency; leveraging process variation; microprocessor design; performance improvement; reliability; substantial clock cycle time margin; supply voltage; Clocks; Delay; Energy consumption; Low voltage; Microprocessors; Power demand; Reliability; Overclocking; energy efficiency; performance; process variation; reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2012.286
  • Filename
    6374616