• DocumentCode
    84568
  • Title

    Plasma Metallization Coating and Its Adhesion to Microwave Transistor Substrate—Part 1: Methods of Experimental Research

  • Author

    Vysikaylo, Philipp I. ; Mitin, Valeriy S. ; Mitin, Aleksey V. ; Krasnobaev, Nikolay N. ; Belyaev, Victor V.

  • Author_Institution
    Plasma Chem. Lab., Moscow Radiotechnical Inst., Moscow, Russia
  • Volume
    43
  • Issue
    4
  • fYear
    2015
  • fDate
    Apr-15
  • Firstpage
    1088
  • Lastpage
    1092
  • Abstract
    A previously proposed mechanism of adhesion of a plasma metal coating to a ceramic substrate is investigated experimentally. This adhesion mechanism is based on the increase in the concentration of structural defects (vacancies) and electron exchange interaction of a metal-oxide beryllium pair during the plasma thermal activation of the process. Given the brazing of ceramic products with hard solders in hydrogen, the coating composition for metallization is determined. The optimal temperature of reactive plasma metals coating for strong adhesion to the ceramic substrate is found. Methods to improve the technology of plasma vacuum metallization using ion-plasma magnetron sputtering and ion implantation are proposed.
  • Keywords
    adhesion; brazing; coatings; exchange interactions (electron); ion implantation; metallisation; microwave transistors; plasma materials processing; sputter deposition; vacancies (crystal); adhesion; brazing; ceramic substrate; electron exchange interaction; hard solders; hydrogen; ion implantation; ion-plasma magnetron sputtering; metal-oxide beryllium pair; microwave transistor; plasma metal coating; plasma metallization coating; plasma thermal activation; structural defects; vacancies; Adhesives; Ceramics; Coatings; Metals; Plasma temperature; Substrates; Diffusion of vacancies; high-power microwave devices; mechanism and kinetics of formation of adhesion; plasma metal coating; power layer; power layer.;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2404833
  • Filename
    7052363