• DocumentCode
    846488
  • Title

    Domino logic with variable threshold voltage keeper

  • Author

    Kursun, Volkan ; Friedman, Eby G.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Rochester, NY, USA
  • Volume
    11
  • Issue
    6
  • fYear
    2003
  • Firstpage
    1080
  • Lastpage
    1093
  • Abstract
    A variable threshold voltage keeper circuit technique is proposed for simultaneous power reduction and speed enhancement of domino logic circuits. The threshold voltage of a keeper transistor is dynamically modified during circuit operation to reduce contention current without sacrificing noise immunity. The variable threshold voltage keeper circuit technique enhances circuit evaluation speed by up to 60% while reducing power dissipation by 35% as compared to a standard domino (SD) logic circuit. The keeper size can be increased with the proposed technique while preserving the same delay or power characteristics as compared to a SD circuit. The proposed domino logic circuit technique offers 14% higher noise immunity as compared to a SD circuit with the same evaluation delay characteristics. Forward body biasing the keeper transistor is also proposed for improved noise immunity as compared to a SD circuit with the same keeper size. It is shown that by applying forward and reverse body biased keeper circuit techniques, the noise immunity and evaluation speed of domino logic circuits are simultaneously enhanced.
  • Keywords
    delay circuits; integrated logic circuits; logic design; semiconductor device noise; transistors; circuit delay; circuit speed; forward body biased keeper circuit; keeper size; keeper transistor; noise immunity; power dissipation; power reduction; reverse body biased keeper circuit; standard domino logic circuit; threshold voltage; transistor biasing; variable threshold voltage keeper circuit; CMOS logic circuits; Circuit noise; Degradation; Delay; Forward contracts; Immune system; Integrated circuit noise; Logic circuits; Threshold voltage; Working environment noise;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2003.817515
  • Filename
    1255482