• DocumentCode
    847126
  • Title

    Demultiplexers for Nanoelectronics Constructed From Nonlinear Tunneling Resistors

  • Author

    Robinett, Warren ; Snider, Greg S. ; Stewart, Duncan R. ; Straznicky, Joseph ; Williams, R.Stanley

  • Author_Institution
    Hewlett Packard Labs., Palo Alto, CA
  • Volume
    6
  • Issue
    3
  • fYear
    2007
  • fDate
    5/1/2007 12:00:00 AM
  • Firstpage
    280
  • Lastpage
    290
  • Abstract
    When using linear resistors to implement nanoelectronic resistor-logic demultiplexers, codes can be used to improve the voltage margins of these circuits. However, the resistors which have been fabricated in nanoscale crossbars are observed to be nonlinear in their current versus voltage (I-V) characteristics, showing an exponential dependence of current on voltage; we call these devices tunneling resistors. The introduction of nonlinearity can either improve or degrade the voltage margin of a demultiplexer circuit, depending on the particular code used. Therefore, the criterion for choosing codes must be redefined for demultiplexer circuits built from this type of nonlinear resistor. We show that for well-chosen codes, the nonlinearity of the resistors can be advantageous, producing a better voltage margin than can be achieved with linear resistors
  • Keywords
    CMOS integrated circuits; demultiplexing equipment; error correction codes; nanoelectronics; resistors; voltage dividers; CMOS; current-voltage characteristics; demultiplexers; error correction coding; nanoelectronics; nanotechnology; nonlinear circuits; nonlinear tunneling resistors; resistive circuits; voltage dividers; Circuits; Degradation; Error correction codes; Nanoelectronics; Nanoscale devices; Nanotechnology; Resistors; Tunneling; Voltage; Wires; Demultiplexing; error correction coding; nanotechnology; nonlinear circuits; resistive circuits; voltage dividers;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2007.893589
  • Filename
    4200736