DocumentCode
847126
Title
Demultiplexers for Nanoelectronics Constructed From Nonlinear Tunneling Resistors
Author
Robinett, Warren ; Snider, Greg S. ; Stewart, Duncan R. ; Straznicky, Joseph ; Williams, R.Stanley
Author_Institution
Hewlett Packard Labs., Palo Alto, CA
Volume
6
Issue
3
fYear
2007
fDate
5/1/2007 12:00:00 AM
Firstpage
280
Lastpage
290
Abstract
When using linear resistors to implement nanoelectronic resistor-logic demultiplexers, codes can be used to improve the voltage margins of these circuits. However, the resistors which have been fabricated in nanoscale crossbars are observed to be nonlinear in their current versus voltage (I-V) characteristics, showing an exponential dependence of current on voltage; we call these devices tunneling resistors. The introduction of nonlinearity can either improve or degrade the voltage margin of a demultiplexer circuit, depending on the particular code used. Therefore, the criterion for choosing codes must be redefined for demultiplexer circuits built from this type of nonlinear resistor. We show that for well-chosen codes, the nonlinearity of the resistors can be advantageous, producing a better voltage margin than can be achieved with linear resistors
Keywords
CMOS integrated circuits; demultiplexing equipment; error correction codes; nanoelectronics; resistors; voltage dividers; CMOS; current-voltage characteristics; demultiplexers; error correction coding; nanoelectronics; nanotechnology; nonlinear circuits; nonlinear tunneling resistors; resistive circuits; voltage dividers; Circuits; Degradation; Error correction codes; Nanoelectronics; Nanoscale devices; Nanotechnology; Resistors; Tunneling; Voltage; Wires; Demultiplexing; error correction coding; nanotechnology; nonlinear circuits; resistive circuits; voltage dividers;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2007.893589
Filename
4200736
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