• DocumentCode
    847980
  • Title

    Multistate per-cell magnetoresistive random-access memory written at Curie point

  • Author

    Zheng, Y.K. ; Wu, Y.H. ; Guo, Z.B. ; Han, G.C. ; Li, K.B. ; Qiu, J.J. ; Xie, H. ; Luo, P.

  • Author_Institution
    Data Storage Inst., Singapore, Singapore
  • Volume
    38
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    2850
  • Lastpage
    2852
  • Abstract
    A multistate per-cell magnetoresistive random-access memory (MRAM) that writes data by a thermally assisted technique and reads data using the angular-dependent magnetoresistance is proposed. A hard magnetic layer or pinned ferromagnetic layer (CoFe-IrMn) is used as the recording layer. The free layer serves as the read layer. Before reading, the free layer´s magnetization is set to the initial state. For the N states per-cell MRAM, the magnetization angle of the ith state (i=0 to N-1) between the free layer and recording layer can be set to be acos(1-2*i/(N-1)). For example, in the four-state per-cell MRAM, the magnetization angle can be set to be acos(1), acos(1/3), acos(-1/3), and acos(-1), which represent the four states, respectively. More states can be obtained if the signal-to-noise ratio is sufficient. At near Curie point, a small external field can be used to record the signal. In order to verify the idea, a spin-valve giant-magnetoresistance memory cell was fabricated using e-beam lithography and ultrahigh voltage sputtering. A 25-mA heating current and a small external field are enough to assist the writing process. A four-state per-cell memory is realized by this method.
  • Keywords
    Curie temperature; cobalt alloys; electron beam lithography; giant magnetoresistance; iridium alloys; iron alloys; magnetic multilayers; magnetic recording noise; magnetisation; manganese alloys; random-access storage; spin valves; sputter deposition; 25 mA; CoFe-IrMn; Curie point; N states per-cell MRAM; angular-dependent magnetoresistance; electron-beam lithography; four-state per-cell MRAM; free layer; hard magnetic layer; heating current; initial state; magnetization angle; multistate per-cell magnetoresistive random-access memory; pinned ferromagnetic layer; read layer; recording layer; signal-to-noise ratio; small external field; spin-valve giant-magnetoresistance memory cell; spin-valve structure; thermally assisted technique; ultrahigh voltage sputtering; Heating; Lithography; Magnetic recording; Magnetization; Magnetoresistance; Read-write memory; Signal to noise ratio; Sputtering; Voltage; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2002.802858
  • Filename
    1042384