• DocumentCode
    848169
  • Title

    Compound barriers in thin film TiO2diodes

  • Author

    Magill, P.J.

  • Volume
    51
  • Issue
    1
  • fYear
    1963
  • Firstpage
    223
  • Lastpage
    224
  • Keywords
    Capacitance measurement; Electrical resistance measurement; Niobium; Rectifiers; Schottky diodes; Semiconductor diodes; Testing; Titanium; Transistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.1690
  • Filename
    1443620
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=848169