• DocumentCode
    853252
  • Title

    Magnetic and structural investigation of heat treated ion beam sputtered amorphous Co74Fe6B15Si5 films

  • Author

    Harris, V.G. ; Oliver, S.A. ; Nowak, W.B. ; Vittoria, C. ; Culbertson, R.J. ; Elam, W.T. ; Kim, K.H.

  • Author_Institution
    Northeastern Univ., Boston, MA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    1990
  • fDate
    9/1/1990 12:00:00 AM
  • Firstpage
    1459
  • Lastpage
    1461
  • Abstract
    As-deposited and annealed specimens of ion-beam-sputtered amorphous Co74Fe6B15Si5 thin films were examined to explore the correlation between changes in magnetic properties and atomic structure. Specimens were characterized magnetically, by traditional AC and DC techniques, and structurally, via conversion-electron extended X-ray absorption fine structure analysis. Results show significant ordering of the higher-order atomic shells around the transition metal ions well below the crystallization temperature. This ordering evolves into body-centered-cubic configuration around both the Co and Fe ions. Increases in nearest-neighbor peak positions in the EXAFS Fourier transforms were observed to correlate with increasing annealing temperatures. Evidence is presented for the role of the ordering in the observed magnetic changes
  • Keywords
    EXAFS; annealing; boron alloys; cobalt alloys; crystal atomic structure of alloys; ferromagnetic properties of substances; iron alloys; magnetic properties of amorphous substances; magnetic thin films; silicon alloys; sputtered coatings; Co74Fe6B15Si5; EXAFS Fourier transforms; amorphous; annealing; atomic structure; conversion-electron extended X-ray absorption fine structure analysis; hysteresis; ion beam sputtered; magnetisation; thin films; Amorphous magnetic materials; Amorphous materials; Annealing; Electromagnetic wave absorption; Ion beams; Iron; Magnetic films; Magnetic properties; Semiconductor thin films; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.104410
  • Filename
    104410