Transition noise properties in longitudinal thin-film media

Author

Zhu, Jian-Gang

Author_Institution

Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

Volume

29

Issue

1

fYear

1993

fDate

1/1/1993 12:00:00 AM

Firstpage

195

Lastpage

200

Abstract

Transition noise properties in longitudinal thin film media are studied by micromagnetic modeling. The mechanism for enhancement of transition noise at small bit intervals due to intertransition interaction is investigated. The noise dependence on the medium parameters, such as saturation magnetization and film thickness, is calculated. Reducing either the saturation magnetization or the film thickness yields a reduction of transition noise at low recording densities and a reduction of the noise enhancement at high recording densities. The effect of stress-induced longitudinal magnetic orientation is studied for an application of a uniaxial and spatial uniform compressive stress in the recording direction. The calculation shows that films with higher orientation ratio exhibit higher transition noise at small bit intervals

Keywords

magnetic recording; magnetic thin films; magnetisation; noise; compressive stress; film thickness; intertransition interaction; longitudinal thin-film media; micromagnetic modeling; noise enhancement; noise mechanism; saturation magnetization; stress-induced longitudinal magnetic orientation; transition noise properties; Crystallization; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Magnetization; Micromagnetics; Noise reduction; Signal to noise ratio; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.195569

Filename

195569