Performance analysis of an ADC histogram test using small triangular waves

Author

Alegria, Francisco ; Arpaia, Pasquale ; Da Cruz Serra, António M. ; Daponte, Pasquale

Author_Institution

Instituto Superior Tecnico, Lisbon, Portugal

Volume

51

Issue

4

fYear

2002

fDate

8/1/2002 12:00:00 AM

Firstpage

723

Lastpage

729

Abstract

The histogram method using small-amplitude triangular waves for the quasi-static test of analog-to-digital converters has been proposed for standardization aims. In this paper, after a brief description of the test procedure, analytical closed-form relations for designing the test, as well as for its characterization in terms of efficiency and uncertainty, are provided. Numerical and experimental results of a comparative analysis with the IEEE 1057-standard static test highlight its better performance in terms of efficiency and accuracy.

Keywords

analogue-digital conversion; graphs; integrated circuit testing; measurement uncertainty; phase noise; signal sampling; standardisation; waveform generators; ADC histogram method; analog-to-digital converters; analytical closed-form relations; efficiency; input equivalent noise; linearity distortion; number of bits; performance analysis; phase noise; quasi-static test; small-amplitude triangular waves; standardization; static test; uncertainty; Analog-digital conversion; Code standards; Distortion; Histograms; Linearity; Performance analysis; Signal generators; Standardization; Testing; Uncertainty;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2002.803292

Filename

1044715