Fast Beamprofile Measurement

The paper deals with a set-up utilizing synchrotron light which allows a fast measurement of beam width and beam height. The most important component of this device is a combination of an image-converter tube with an electron multiplying dynode system. The scan velocity is between .1 and .3 mm/¿s and could be made even faster. This makes possible the measurements of acceptance, beam emittance, dynamical change of beam position and change of transverse beam dimensions during an accelarating cycle in an electron synchrotron. The device has also been used to measure fast cross section changes in the PETRA storage ring.