• DocumentCode
    856676
  • Title

    Fast and accurate intermediate-level modelling approach for EMC analysis of enclosures

  • Author

    Flintoft, I.D. ; Whyman, N.L. ; Dawson, J.F. ; Konefal, T.

  • Author_Institution
    Dept. of Electron., York Univ., UK
  • Volume
    149
  • Issue
    5
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    281
  • Lastpage
    285
  • Abstract
    Intermediate-level circuit models use circuit models containing transmission lines to represent the waveguide modes in an enclosure. The coupling of electromagnetic fields to contents, and apertures is achieved by the use of circuit approximations. Typical models run in a few seconds on a personal computer, compared with many hours, or even days, required for full-wave simulations of the same problem. This efficiency allows the intermediate-level models to be used in situations where the time and effort involved in full-wave simulations would be prohibitive. The technique is reviewed, discussing both its relation to full-wave simulations and the type of problems for which it is a particularly appropriate tool. Example applications to the prediction of the immunity of a generic missile (GENEC) are given, based on extensions of the model to enclosures with a circular cross-section. The models have been validated by measurements on GENEC and comparison with other simulation techniques. A coupling model has also been developed for small apertures in the sidewall of the waveguide using aperture polarisability theory. The results demonstrate that excellent agreement with measurements can be obtained at frequencies up to 3 GHz.
  • Keywords
    UHF radio propagation; electromagnetic compatibility; electromagnetic coupling; missiles; waveguide theory; EMC analysis; GENEC; UHF; aperture polarisability theory; circuit approximations; electromagnetic fields; enclosures; generic missile; intermediate-level circuit models; intermediate-level modelling; sidewall; transmission lines; waveguide modes;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:20020542
  • Filename
    1044849