DocumentCode
858249
Title
On the Accuracy of the Parameters Extracted From
-Parameter Measurements Taken on Differential IC Transmission Lines
Author
Tiemeijer, Luuk F. ; Pijper, Ralf M T ; Van Noort, Wibo
Author_Institution
Res. Centre, NXP Semicond.-Taiwan Semicond. Manuf. Co., Eindhoven
Volume
57
Issue
6
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
1581
Lastpage
1588
Abstract
In this paper, we compare the accuracy of the telegrapher´s equation transmission line parameters extracted with different methods from deembedded S-parameter measurements taken on differential integrated circuit transmission lines. We present a mathematical proof that conventional ldquoopen-shortrdquo deembedding is sufficient to extract the intrinsic propagation constant gamma of the transmission line, but that at the same time, some deembedding errors will remain for the extracted characteristic impedance Z 0. We illustrate this by comparing experimental results obtained after ldquoopen-shortrdquo and ldquoshort-openrdquo deembedding, and explain that as a result of this, using either known capacitance/known conductance or known inductance/known resistance approximations to study the remaining transmission line parameters can be attractive.
Keywords
high-frequency transmission lines; integrated circuit interconnections; S-parameter measurements; capacitance-known capacitance; deembedded -parameter measurements; deembedding errors; differential IC transmission lines; extracted characteristic impedance Z0; intrinsic propagation constant gamma; known inductance-known resistance approximations; open-short deembedding; short-open deembedding; Deembedding; integrated circuits; on-chip interconnect transmission lines; on-wafer microwave measurements;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2009.2020821
Filename
4915769
Link To Document