Line broadening and intensity noise due to polarization switching in external cavity diode lasers

Author

Syvridis, D. ; Guekos, G.

Author_Institution

Inst. of Quantum Electron., Swiss Federal Inst. of Technol., Zurich, Switzerland

Volume

5

Issue

2

fYear

1993

Firstpage

151

Lastpage

154

Abstract

The authors report on polarization switching as a new source of linewidth broadening and intensity noise in external grating diode laser setups that emit in a sequence of alternating wavelength intervals having TE and TM polarization, respectively. At the borders between two consecutive intervals, the continuous random hopping of the system between the two polarizations results in line broadening and in RIN values of -100 dB/Hz at frequencies below 100 MHz. In the middle part of each wavelength interval, linewidth of less than 300 kHz and low noise (<-145 dB/Hz) have been measured.<>

Keywords

diffraction gratings; laser cavity resonators; light polarisation; semiconductor device noise; semiconductor lasers; spectral line breadth; RIN values; TE polarization; TM polarization; continuous random hopping; external cavity diode lasers; external grating; intensity noise; linewidth; linewidth broadening; low noise; polarization switching; Diode lasers; Gratings; Laser tuning; Optical devices; Optical fiber polarization; Optical noise; Optical polarization; Stimulated emission; Tellurium; Wavelength measurement;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.195987

Filename

195987