• DocumentCode
    858292
  • Title

    Carrier density fluctuation noise in field-effect transistors

  • Author

    van der Ziel, A.

  • Volume
    51
  • Issue
    11
  • fYear
    1963
  • Firstpage
    1670
  • Lastpage
    1671
  • Keywords
    Charge carrier density; Circuit noise; Estimation error; FETs; Fluctuations; Maximum likelihood estimation; Monte Carlo methods; Random variables; Temperature; Writing;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1963.2659
  • Filename
    1444589
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=858292