• DocumentCode
    859299
  • Title

    Vortex-glass-liquid transition and critical current density in Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ superconductors

  • Author

    Yamasaki, H. ; Endo, K. ; Mawatari, Y. ; Kosaka, S. ; Umeda, M. ; Yoshida, S. ; Kajimura, K.

  • Author_Institution
    Electrotech. Lab., Ibaraki, Japan
  • Volume
    5
  • Issue
    2
  • fYear
    1995
  • fDate
    6/1/1995 12:00:00 AM
  • Firstpage
    1888
  • Lastpage
    1891
  • Abstract
    We have investigated I-V characteristics in epitaxial Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/, thin films and Ag-sheathed tapes in magnetic fields applied parallel to the c-axis, and observed a transition from the vortex-liquid phase characterized by finite linear resistivity /spl rho//sub lin/=(E/J)/sub J/spl rarr/0/=constant, to the vortex-glass phase with vanishing linear resistivity. The transition shows quasi-2D nature and a power-law relation E/spl sim/J/sup z+1//spl ap/J/sup 6.5/ is observed at the transition temperature T/sub g/, while E/spl sim/J/sup z+1//2/spl ap/J/sup 3/ is observed in YBa/sub 2/Cu/sub 3/O/sub 7/ at T=T/sub g/, where z is a critical exponent. The importance of the vortex-glass transition in applied superconductivity is discussed.<>
  • Keywords
    bismuth compounds; calcium compounds; critical current density (superconductivity); flux-line lattice; high-temperature superconductors; strontium compounds; superconducting epitaxial layers; superconducting tapes; superconducting thin films; Ag-sheathed tapes; Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O; I-V characteristics; critical current density; epitaxial thin films; finite linear resistivity; high temperature superconductors; power-law relation; vanishing linear resistivity; vortex glass-liquid transition; Bismuth; Conductivity; Critical current density; Glass; Magnetic fields; Magnetic films; Strontium; Superconducting thin films; Superconducting transition temperature; Superconductivity;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.402950
  • Filename
    402950