• DocumentCode
    86085
  • Title

    Narrow Linewidth 1550 nm Corrugated Ridge Waveguide DFB Lasers

  • Author

    Dridi, K. ; Benhsaien, A. ; Zhang, Juyong ; Hall, Trevor J.

  • Author_Institution
    Photonic Technol. Lab., Univ. of Ottawa, Ottawa, ON, Canada
  • Volume
    26
  • Issue
    12
  • fYear
    2014
  • fDate
    15-Jun-14
  • Firstpage
    1192
  • Lastpage
    1195
  • Abstract
    We report on the design and characterization of InP-based multiple quantum well corrugated ridge waveguide distributed feedback diode lasers operating at 1550 nm. Third-order gratings have been etched along the sidewalls of the ridge waveguide using the standard I-line stepper lithography technique with an inductively coupled reactive ion etching process. An as-cleaved 1500-μm-long laser diode shows stable continuous wave single-mode operation at 1550 nm with high side-mode suppression ratios (>50 dB), a temperature-dependent wavelength shift dλ/dT ~0.095 nm/°C, and output powers ≥7 mW at 25 °C. Linewidth determination has been carried using the delayed self-heterodyne interferometric technique. Narrow linewidths (≤250 kHz) have been observed for a wide range of current injection, with a minimum of 184 kHz at 300 mA.
  • Keywords
    III-V semiconductors; diffraction gratings; distributed feedback lasers; indium compounds; laser modes; laser stability; photolithography; quantum well lasers; ridge waveguides; sputter etching; waveguide lasers; InP; InP-based multiple quantum well corrugated ridge waveguide distributed feedback diode lasers; current 300 mA; current injection; delayed self-heterodyne interferometric technique; inductively coupled reactive ion etching process; narrow linewidth corrugated ridge waveguide DFB lasers; output power; side-mode suppression ratio; size 1500 mum; stable continuous wave single-mode operation; standard I-line stepper lithography; temperature 25 degC; temperature-dependent wavelength shift; third-order gratings; wavelength 1550 nm; Distributed feedback devices; Gratings; Laser feedback; Laser modes; Measurement by laser beam; Semiconductor lasers; Waveguide lasers; Distributed feedback (DFB) lasers; InP/InGaAsP multiple quantum well (MQW); Lorentzian lineshape; Voigt profile; delayed self-heterodyne interferometry; stepper lithography;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2014.2318593
  • Filename
    6802359