• DocumentCode
    861042
  • Title

    Low-Noise Crystalline Soft Underlayer for CoCrPt:SiO2 Perpendicular Recording Media

  • Author

    Shi, J.Z. ; Piramanayagam, S.N. ; Zhao, J.M. ; Mah, C.S. ; Kay, Y.S. ; Ong, C.Y.

  • Author_Institution
    Data Storage Inst.
  • Volume
    43
  • Issue
    6
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    2100
  • Lastpage
    2102
  • Abstract
    In this paper, a crystalline soft underlayer with chemical formula (Fe15Co85)94Cr3Ta3 for CoCrPt:SiO2-based perpendicular media is studied. Three kinds of approaches are used to successfully reduce the noise from the soft underlayer. X-ray diffraction is used to study the effect of the preparation parameters on the orientations of the soft underlayer and the recording layer. The mechanism for the noise reduction is discussed
  • Keywords
    X-ray diffraction; chromium alloys; cobalt alloys; crystal microstructure; ferromagnetic materials; granular materials; iron alloys; magnetic recording noise; magnetic thin films; metallic thin films; perpendicular magnetic recording; platinum alloys; silicon compounds; soft magnetic materials; tantalum alloys; (Fe15Co85)94Cr3Ta 3; CoCrPt:SiO2; SUL orientation; X-ray diffraction; granular perpendicular recording media; low-noise crystalline soft underlayer; noise reduction; recording layer orientation; soft underlayer microstructure; Argon; Chromium; Crystallization; Iron; Low-frequency noise; Magnetic noise; Microstructure; Noise reduction; Optical noise; Perpendicular magnetic recording; Crystalline soft underlayer; noise; orientation; perpendicular recording media;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2007.893838
  • Filename
    4202908
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=861042