• DocumentCode
    862405
  • Title

    High performance poly-Si TFTs fabricated by continuous-wave laser annealing of metal-induced lateral crystallised silicon films

  • Author

    Chang, Chorng-Ping ; Wu, Y.S.

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    44
  • Issue
    19
  • fYear
    2008
  • Firstpage
    1157
  • Lastpage
    1158
  • Abstract
    In this process, amorphous silicon was first transformed to polycrystalline silicon (poly-Si) using a metal-induced lateral crystallisation (MILC) process, followed by annealing with a continuous-wave laser lateral ( lambda~ 532 nm) crystallisation (CLC) with an output power of 3.8 W. MILC-CLC-TFT performed far superior to MILC-TFT. The mobility of the MILC-CLC-TFT was 293 cm2/Vs, which was much higher than that of MILC TFTs (54.8 cm2/Vs). In addition, MILC-CLC TFTs showed better device uniformity and reliability.
  • Keywords
    crystallisation; laser beam annealing; thin film transistors; MILC-CLC-TFT; amorphous silicon; continuous-wave laser annealing; continuous-wave laser lateral crystallisation; metal-induced lateral crystallisation process; metal-induced lateral crystallised silicon films; poly-Si TFT; polycrystalline silicon; power 3.8 W; thin film transistor;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20081620
  • Filename
    4625198