DocumentCode
863297
Title
Degradation Characteristics of Au-Si Nuclear Detectors by a Few MeV Charged Particle Irradiation
Author
Ohba, K. ; Shoji, T. ; Ito, S. ; Hiratate, Y.
Author_Institution
Department of Electronics Tohoku Institute of Technology Yagiyama, Sendai 982, Japan
Volume
30
Issue
1
fYear
1983
Firstpage
371
Lastpage
375
Abstract
It is found that a Si surface barrier detector has been degraded after 3.2 MeV protons or 3.5 MeV 3He particle irradiation with low doses ranging from 1011 to 1012 cm-2. The degradation characteristics have been investigated through the changes in the reverse current, capacitance, alpha-particle counting response and DLTS measurements. 3He particle irradiation produces a change of the capacitance at lower reverse bias compared to that of proton irradiation, indicating the defect creation at the short penetration depth of 3He particles. Capacitance-voltage characteristics of the irradiated detectors can be simply analysed using Poisson´s equation with an assumption that the charge defects are created within the depletion layers. Such kinds of defects are considered as electron traps at 0.36, 0.45 and 0.51 eV from the conduction band.
Keywords
Capacitance; Capacitance-voltage characteristics; Current measurement; Degradation; Gold; Particle beams; Poisson equations; Protons; Radiation detectors; Silicon radiation detectors;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4332291
Filename
4332291
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