DocumentCode

863633

Title

Microwave measurement of surface conductance of semiconductors

Author

Roy, Sandip Kumar ; Nag, B.R.

Volume

52

Issue

7

fYear

1964

fDate

7/1/1964 12:00:00 AM

Firstpage

873

Lastpage

874

Keywords

Conductivity; Dielectric constant; Equations; Frequency; Germanium; Microwave measurements; Scattering; Silicon; Slabs; Surface waves;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1964.3165

Filename

1445095