• DocumentCode
    86386
  • Title

    SiC Research and Development at United Silicon Carbide Inc.?Looking Beyond 650?1,200 V Diodes and Transistors [Happenings]

  • Author

    Dries, J. Christopher

  • Volume
    2
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    12
  • Lastpage
    15
  • Abstract
    For over a decade now, silicon carbide (SiC) Schottky diodes have been used in myriad high performance power-conversion applications. Currently, the largest among these applications is power factor correction utilizing 650-V SiC Schottky diodes. The introduction of SiC transistor offerings at 1,200 V, beginning in 2010 with junction field-effect transistors (JFETs) and followed by SiC metal?oxide?semiconductor field-effect transistors (MOSFETs) and bipolar junction transistors in subsequent years, is simply the beginning of a wave of commercial devices of increasingly high voltage and current ratings. In this column, we describe the direction that United Silicon Carbide Inc. (USCi) is taking in advancing the state of the art of SiC devices following the introduction of our suite of 650- and 1,200-V diodes and JFETs to the marketplace in early 2014.
  • Keywords
    Diodes; Research and development; Schottky diodes; Semiconductor devices; Silicon carbide; Transistors;
  • fLanguage
    English
  • Journal_Title
    Power Electronics Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    2329-9207
  • Type

    jour

  • DOI
    10.1109/MPEL.2014.2381995
  • Filename
    7054046