Simulation of the recording process with a VSM on Co-Cr and Co-Ni-O layers deposited at oblique incidence

Author

Bernards, J.P.C. ; van Engelen, G.J.P. ; Schrauwen, C.P.G. ; Cramer, H.A.J. ; Luitjens, S.B.

Author_Institution

Philips Res. Lab., Eindhoven, Netherlands

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2289

Lastpage

2291

Abstract

The recording process on Co-Cr and Co-Ni-O layers deposited at oblique incidence is simulated with a vibrating sample magnetometer. The Co-Cr layers are deposited on Si substrates and have an easy magnetization direction tilted 15° from the normal to the layer, which is caused by the presence of columnar-shape anisotropy. The simulation experiments show that such a layer is more sensitive to one side of the perpendicular component of the write field of a ring head. The Co-Ni-O sample has an easy direction of magnetization tilted about 20° out of the plane. The simulation experiments show that the steepness of the transition is different for the two directions of head movement

Keywords

chromium alloys; cobalt alloys; cobalt compounds; magnetic anisotropy; magnetic recording; magnetic tapes; magnetic thin films; nickel compounds; sputtered coatings; Co-Ni-O; CoCr-Si; Si substrates; columnar-shape anisotropy; magnetization direction; recording process; simulation experiments; vibrating sample magnetometer; write field; Anisotropic magnetoresistance; Frequency response; Laboratories; Magnetic field measurement; Magnetic heads; Magnetization; Magnetometers; Probes; Rotation measurement; Shape;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104700

Filename

104700