• DocumentCode
    864169
  • Title

    Observations of negative–resistance phenomena and oscillations in the MOS diode

  • Author

    Hayashi, Teruaki ; Niimi, Takuya

  • Volume
    52
  • Issue
    8
  • fYear
    1964
  • Firstpage
    986
  • Lastpage
    986
  • Keywords
    Conductivity; Diodes; Semiconductor films; Silicon; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1964.3214
  • Filename
    1445144