DocumentCode
864175
Title
Electrically Tunable Silicon 2-D Photonic Bandgap Structures
Author
Haurylau, Mikhail ; Anderson, Sean P. ; Marshall, Kenneth L. ; Fauchet, Philippe M.
Author_Institution
Dept. of Electr. & Comput. Eng., Rochester Univ., NY
Volume
12
Issue
6
fYear
2006
Firstpage
1527
Lastpage
1533
Abstract
Electrical tuning of high refractive index-contrast photonic bandgap (PBG) structures is required for a majority of PBG applications, particularly for integrated optics. When the host material is a semiconductor with poor electro-optical properties, tuning can be achieved by infiltrating the structure with an active optical material. In this paper we analyze the switching of electro-optic material in such structures, and suggest design rules to help achieve electrical tuning. In particular, a design concept that eliminates the electric field screening effects is proposed. The developed rules and concepts are demonstrated by the electrical tuning of liquid crystals inside two-dimensional porous silicon PBG structures. This approach can be generalized to different combinations of semiconductor PBG structures and active optical materials
Keywords
electro-optical effects; electro-optical switches; elemental semiconductors; integrated optics; liquid crystals; optical materials; photonic band gap; porous semiconductors; refractive index; silicon; Si; active optical material; electric field screening effects; electrical tuning; electrooptic switching; electrooptical properties; integrated optics; liquid crystals; porous silicon structures; refractive index; silicon photonic bandgap; two-dimensional photonic bandgap; Crystalline materials; Laser tuning; Liquid crystals; Optical materials; Optical refraction; Optical tuning; Photonic band gap; Photonic crystals; Semiconductor materials; Silicon; Electro-optic material; field screening; liquid crystals; photonic bandgap (PBG); silicon;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2006.884084
Filename
4032655
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