The domain wall distortion of magnetically written bits in GdTbFe thin films

Author

Ohtani, Y. ; Yoshimura, F. ; Hatakeyama, I.

Author_Institution

NTT Appl. Electron. Lab., Ibaraki, Japan

Volume

26

Issue

5

fYear

1990

fDate

9/1/1990 12:00:00 AM

Firstpage

2292

Lastpage

2294

Abstract

The distortion of the bits formed by a magnetic head was studied on GdTbFe films. From read/write tests, it is found that reproduction noise is strongly affected by the film sputtering gas pressure (0.2-0.6 Pa); high Ar pressure causes less reproduction noise. Jitter analysis with a magnetooptical read head indicates that domain-wall distortion decreases as the deposition pressure increases. This distortion amplitude is found to roughly coincide with the distance between iron microcrystallites (about 10 Å to 60 Å in diameter), which are assumed to provide nucleation sites for magnetization reversal

Keywords

gadolinium alloys; iron alloys; magnetic domain walls; magnetic recording; magnetic thin films; magnetisation reversal; terbium alloys; GdTbFe; domain-wall distortion; film sputtering gas pressure; magnetic head; magnetically written bits; magnetization reversal; magnetooptical read head; microcrystallites; nucleation sites; reproduction noise; thin films; Argon; Jitter; Magnetic analysis; Magnetic domain walls; Magnetic domains; Magnetic films; Magnetic heads; Magnetic noise; Sputtering; Testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.104701

Filename

104701