DocumentCode
864783
Title
Coherent K-Ionization Using a H2+ Beam
Author
Fou, Cheng-Ming ; Fou, Theresa S.
Author_Institution
Department of Physics University of Delaware, Newark, DE 19711
Volume
30
Issue
2
fYear
1983
fDate
4/1/1983 12:00:00 AM
Firstpage
1018
Lastpage
1019
Abstract
A 1.0 MeV H2+ beam from the University of Delaware van de Graaff accelerator was used to bombard a thin Nickel target. Characteristic K X-ray from Ni was measured with a thin NaI(Tl) detector in coincidence with protons scattered into 90° and 165° lab angles. The energy of the protons detected in those angles corresponds to the elastic scattering of 0.5 MeV incident H+ beam because of the negligible (2.65 eV) bound energy between H and proton in H2+. However, the ionization probabilities measured in the 1 MeV H2+ beam case differ from that measured with a 0.5 MeV proton beam. While the ionization probability for the 165° scattering is increased with the H2+ beam, the reverse is true for the 90° scattering. Possible coherent effect is being considered.
Keywords
Atomic beams; Atomic measurements; Collimators; Ionization; Nickel; Particle beams; Particle scattering; Probability; Protons; X-ray scattering;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4332441
Filename
4332441
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