• DocumentCode
    864783
  • Title

    Coherent K-Ionization Using a H2+ Beam

  • Author

    Fou, Cheng-Ming ; Fou, Theresa S.

  • Author_Institution
    Department of Physics University of Delaware, Newark, DE 19711
  • Volume
    30
  • Issue
    2
  • fYear
    1983
  • fDate
    4/1/1983 12:00:00 AM
  • Firstpage
    1018
  • Lastpage
    1019
  • Abstract
    A 1.0 MeV H2+ beam from the University of Delaware van de Graaff accelerator was used to bombard a thin Nickel target. Characteristic K X-ray from Ni was measured with a thin NaI(Tl) detector in coincidence with protons scattered into 90° and 165° lab angles. The energy of the protons detected in those angles corresponds to the elastic scattering of 0.5 MeV incident H+ beam because of the negligible (2.65 eV) bound energy between H and proton in H2+. However, the ionization probabilities measured in the 1 MeV H2+ beam case differ from that measured with a 0.5 MeV proton beam. While the ionization probability for the 165° scattering is increased with the H2+ beam, the reverse is true for the 90° scattering. Possible coherent effect is being considered.
  • Keywords
    Atomic beams; Atomic measurements; Collimators; Ionization; Nickel; Particle beams; Particle scattering; Probability; Protons; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1983.4332441
  • Filename
    4332441